SPEKTRAL RENTGEN KT ORQALI RENTGEN YUTILISHINI AJRATISH YORDAMIDA MATERIALLARNI TASNIFLASHNING YAXSHILANGAN PARAMETRIZATSIYASI

Authors

  • D.R. Jumanazarov Abu Rayhon Beruniy nomidagi Urgench State University Author
  • M.R. Ro’zmetova Mamun Universitety Author
  • S.Sh.Ruzimov Xazarasp tumanidagi 2-son Politexnikumi o’qituvchisi Author

Keywords:

spektral rentgen KT, foton-sanovchi detektor, yutilishni ajratish, fotoelektrik effekt, Kompton sochilishi, elektron zichligi, effektiv atom raqami, xavfsizlik skrininggi

Abstract

Maqolada foton-sanovchi CdTe detektorli spektral rentgen KT da chiziqli susaytirish koeffitsiyentini (ChSK) fotoelektrik yutilish va Kompton sochilishi komponentlariga ajratish orqali moddalarning elektron zichligi (ρe) va effektiv atom raqamini (Zeff) tizimdan mustaqil baholash usulining parametrizatsiyasi tahlil qilinadi. Fotoelektrik daraja ko‘rsatkichi n va bazis funksiyalarni kalibrlash, energiya binlarini optimal tanlash hamda spektral korreksiya bilan birgalikda qo‘llanganda 6 ≤ Zeff≤ 23 oralig‘idagi 16 ta modda uchun o‘rtacha xato ρe bo‘yicha 1,5% va Zeff bo‘yicha 3,1% ni tashkil etdi. Bu natijaga atigi ikkita energiya bini bilan erishildi, bu esa tomografik tiklash vaqtini 32 martagacha qisqartiradi

References

1. Jumanazarov D., Atamurotov F., Xudoynazarov E., Matyokubov K., Saparbaev R., Abdikarimov X., Olsen U. L. Method for the correction of spectral distortions in X-ray photon-counting detectors // IEEE Transactions on Instrumentation and Measurement. 2025. Vol. 74. Art. 6001315. DOI: 10.1109/TIM.2025.3529057.

2. Jumanazarov D., Koo J., Busi M., Poulsen H. F., Olsen U. L., Iovea M. System-independent material classification through X-ray attenuation decomposition from spectral X-ray CT // NDT & E International. 2020. Vol. 116. Art. 102336. DOI: 10.1016/j.ndteint.2020.102336.

3. Alvarez R. E., Macovski A. Energy-selective reconstructions in X-ray computerised tomography // Physics in Medicine and Biology. 1976. Vol. 21, No. 5. P. 733–744.

4. Azevedo S. G., Martz H. E., Aufderheide M. B., Brown W. D., Champley K. M., Kallman J. S. et al. System-independent characterization of materials using dual-energy computed tomography // IEEE Transactions on Nuclear Science. 2016. Vol. 63, No. 1. P. 341–350.

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Published

12.10.2026

How to Cite

SPEKTRAL RENTGEN KT ORQALI RENTGEN YUTILISHINI AJRATISH YORDAMIDA MATERIALLARNI TASNIFLASHNING YAXSHILANGAN PARAMETRIZATSIYASI. (2026). ZAMONAVIY TA’LIMDA ISLOHOTLAR VA TEXNIK TAFAKKUR, 1(2), 770-776. https://texniktafakkur.com/ttp/article/view/144

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